Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Hardcover)

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Description


Since its invention in 1982, scanning tunneling microscopy (STM) has enabled users to obtain images reflecting surface electronic structure with atomic resolution. This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials
science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. Scanning Force Microscopy, Revised Edition updates the earlier edition's survey of the many rapidly developing subjects concerning the mapping
of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book an
excellent introduction to this rapidly developing field.
Product Details
ISBN: 9780195092042
ISBN-10: 019509204X
Publisher: Oxford University Press, USA
Publication Date: August 25th, 1994
Pages: 288
Language: English
Series: Oxford Series in Optical & Imaging Sciences