Practical Electron Microscopy of Lattice Defects (Hardcover)

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Description


This unique reference text provides those who are studying crystal lattice defects using a transmission electron microscope (TEM) with a basic knowledge of transmission electron microscopy. As it has been written for beginners, the principles of both transmission electron microscopy and crystallography have been clearly and simply explained, with the use of many figures and photographs to aid understanding. Mathematics is avoided where possible, and problems and exercises are amply provided.
Product Details
ISBN: 9789811234699
ISBN-10: 9811234698
Publisher: World Scientific Publishing Company
Publication Date: April 26th, 2021
Pages: 308
Language: English